Program Agenda
| Time | Duration | Speaker & Affiliation | Talk Details |
|---|---|---|---|
| 09:15 AM | 15 Mins | Welcome and Inauguration | |
| 09:30 AM | 45 Mins | Dr. Harald Gossner (Intel, Germany) |
The Picosecond Challenge in CDM Testing – endangering ESD Robustness of Highspeed Interfaces (Keynote) |
| 10:15 AM | 45 Mins | Prof. Elyse Rosenbaum (UIUC, USA) |
ESD Design for High-speed Wireline IOs in Advanced CMOS Technologies (Keynote) |
| 11:00 AM | 30 Mins | Break | Break |
| 11:30 AM | 30 Mins | Mr. Mototsugu Okushima (Renesas Electronics, Japan) |
Efficient CDM Protection Design for Cross Power Domain of Analog/RF block in Finfet Technology (Invited) |
| 12:00 PM | 30 Mins | Dr. Teruo Suzuki (Socionext Inc., Japan) |
Consideration based on ESD applied waveform in High-Speed IF using T-Coil (Invited) |
| 12:30 PM | 30 Mins | Dr. Dolphin Abessolo Bidzo (NXP Semiconductors, The Netherlands) |
Electronic Design Automation (EDA) Layout Verification Methodology for Charged Device Model (CDM) (Invited) |
| 01:00 PM | 90 Mins | Networking Lunch | Networking Lunch |
| 02:30 PM | 30 Mins | Dr. Hossam Sarhan (Siemens, USA) |
Ensuring Sign-off Design Reliability: Navigating Complex Requirements using Calibre® PERC™ |
| 03:00 PM | 30 Mins | Mitesh Goyal (Indian Institute of Science) |
Load-line Dependent Current Filament Dynamics in Nanoscale SCR Devices (PhD Talk) |
| 03:30 PM | 30 Mins | Mohammad Ateeb Munshi (Indian Institute of Science) |
Understanding Temperature Dependence of ESD Reliability in AlGaN/GaN HEMTs (PhD Talk) |
| 04:00 PM | 30 Mins | Rasik Rashid Malik (Indian Institute of Science) |
Interplay of Surface Passivation and Electric Field Distribution in Determining ESD Behaviour of p-GaN Gated AlGaN/GaN HEMTs (PhD Talk) |
| 04:30 PM | 30 Mins | Coffee Break | Coffee Break |
| 05:00 PM | 60 Mins | Moderator: Prof. Mayank Shrivastava (Indian Institute of Science) |
Panel Session: Semiconductor Advancements & Growing ESD Challenges |
| 06:00 PM | 90 Mins | Poster Session | |
| 07:30 PM | 120 Mins | Chair's Reception & Dinner | |
| Time | Duration | Speaker & Affiliation | Talk Details |
|---|---|---|---|
| 09:00 AM | 45 Mins | Dr. Gianluca Boselli (Texas Instruments, USA) |
System-Level ESD design challenges in HV Automotive Applications: process, IP and system co-design perspective (Keynote) |
| 09:45 AM | 45 Mins | Dr. Charvaka Duvvury (iT2 Technologies, USA) |
Exploring Machine Learning for ESD Data Analysis (Keynote) |
| 10:30 AM | 20 Mins | Prof. Mayank Shrivastava (Indian Institute of Science) |
Predictive TCAD-Based ESD Design without Foundry Data |
| 10:50 AM | 10 Mins | Mr. Sharath B N (COMSOL) |
Multiphysics Simulation for the Semiconductor Industry |
| 11:00 AM | 30 Mins | Break | Break |
| 11:30 AM | 30 Mins | Dr. Matteo Buffolo (University of Padova, Italy) |
Robustness of GaN-based LED against EOS events and ESDs (Invited) |
| 12:00 PM | 30 Mins | Ms. Yang Yanjing (ThermoFisher Scientific, Singapore) |
Failure Analysis workflow for Advanced Packing and Power Semiconductor Device (Invited) |
| 12:30 PM | 30 Mins | Mr. Christopher Almeras (Raytheon, USA) |
Risk Mitigation in Manufacturing of High Reliability Product (Invited) |
| 01:00 PM | 90 Mins | Networking Lunch | Networking Lunch |
| 02:30 PM | 30 Mins | Prof. David Pommerenke (Technical University Graz, Austria) |
System Efficient ESD Design |
| 03:00 PM | 30 Mins | Dr. Kranthi Nagothu (Texas Instruments, USA/India) |
On-chip protection Design Challenges for system level ESD (Invited) |
| 03:30 PM | 30 Mins | Monishmurali M (Texas Instruments) |
Addressing design challenges for current uniformity in Fin-based SCRs (PhD Talk) |
| 04:00 PM | 30 Mins | Dr. Charvaka Duvvury (iT2 Technologies, USA) |
Green ESD: Efficient Test Methods to Save Time and Effort During Qualification |
| 04:30 PM | 30 Mins | Coffee Break | Coffee Break |
| 05:00 PM | 15 Mins | Anamika Chowdhury (Lam Research) |
Low Pressure Reactor Design to Avoid Unwanted Electrostatic Discharge | 05:15 PM | 15 Mins | Anurag Mittal (Synopsys, India) |
I/O ESD implementation for 2.5D/3D Applications(Contributed) |
| 05:30 PM | 15 Mins | Chinmayee Panigarhi (NXP Semiconductors) |
Challenges in ESD protection for High-Speed CML transmitter having thin oxide devices and their solution (Contributed) |
| 05:45 PM | 15 Mins | Dattatreya Prabhu Rachakonda (GlobalFoundries, India) |
Learnings from Switch Self-Protection: From models to hardware (Contributed) |
| 06:00 PM | 15 Mins | Harshit Dhakad (Intel Technologies India Pvt.) |
Tracing and debugging of ESD failures in a module assembly line (Contributed) |
| 06:15 PM | 15 Mins | Gopikrishna Siddula (Western Digital, India) |
Enhancing Reliability in High speed and High-Density Storage: Practical Strategies for Mitigating Electrostatic Discharge (ESD) (Contributed) |
| 06:30 PM | 15 Mins | Manohar Seetharam (Samsung, India) |
ESD design challenges and solutions for Mphy G5 transceiver design in 2/3nm (Contributed) |
| 06:45 PM | 30 Mins | Networking, Poster and Hi-tea | |
| 07:15 PM | 15 Mins | Concluding remarks, Vote of thanks & 6th InEW Announcement | |
